Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces (English, Weronika Walkosz)
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Book Details
Publisher
Springer
Language
English
ISBN-13
9781441978165
ISBN-10
144197816X
Author
Weronika Walkosz
About the Book
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β - Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF). These interfaces are of a great fundamental and technological interest because they play an impo…
ISBN: 9781441978165
ISBN-13: 9781441978165
ISBN-10: 144197816X
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Product ID: isbn-9781441978165
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