Built-In-Self-Test and Digital Self-Calibration for RF Socs (English, Sleiman Bou-Sleiman | Mohammed Ismail)
by Sleiman Bou-Sleiman | Mohammed Ismail
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Built-In-Self-Test and Digital Self-Calibration for RF Socs by Sleiman Bou-Sleiman | Mohammed Ismail is listed under Electronics on BookBajar. Full details, specifications and reader reviews are below.
Book Details
Publisher
Springer
Language
English
ISBN-13
9781441995476
ISBN-10
1441995471
Author
Sleiman Bou-Sleiman | Mohammed Ismail
About the Book
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
ISBN: 9781441995476
ISBN-13: 9781441995476
ISBN-10: 1441995471
Reader's Guide
What This Book Covers
- ·The main subject matter of Built-In-Self-Test and Digital Self-Calibration for RF Socs
- ·Ideas and detail relevant to Electronics
- ·Context that helps make sense of the material as a whole
Best Suited For
Readers with an interest in Electronics, from students to hobbyists.
Why It Stands Out
- ·Ships as a genuine physical copy, checked before dispatch
- ·Covered by BookBajar's 15-day return window
Frequently Asked Questions
What is the price of Built-In-Self-Test and Digital Self-Calibration for RF Socs?
Built-In-Self-Test and Digital Self-Calibration for RF Socs starts from ₹5487 at BookBajar. Available in Paperback.
Who is the author of Built-In-Self-Test and Digital Self-Calibration for RF Socs?
Sleiman Bou-Sleiman | Mohammed Ismail is the author of Built-In-Self-Test and Digital Self-Calibration for RF Socs. Browse more books by Sleiman Bou-Sleiman | Mohammed Ismail on BookBajar.
Is Built-In-Self-Test and Digital Self-Calibration for RF Socs available in Paperback and Hardcover?
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What is the ISBN of Built-In-Self-Test and Digital Self-Calibration for RF Socs?
Built-In-Self-Test and Digital Self-Calibration for RF Socs has ISBN 9781441995476 (ISBN-10: 1441995471). Use this to confirm you're ordering the exact edition listed here.
What can I expect from Built-In-Self-Test and Digital Self-Calibration for RF Socs?
About the Book This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). ISBN: 9781441995476
Product ID: isbn-9781441995476
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