Thin Film Analysis by X-Ray Scattering (English, Hardcover, M Birkholz)

About the Book

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of th...

Why You Should Read This Book

• Written by acclaimed author M Birkholz
• Published by Atlantic Publishers and Distributors (P) Ltd., 7/22, Ansari Road, Darya Ganj, New Delhi - 110002 INDIA, Email – customercare@atlanticbooks.com, Ph – 011-47320500 (2005)
• 378 pages of comprehensive content
• Available in English language
• Ideal for students, professionals, and avid readers

Product Details

This edition of Thin Film Analysis by X-Ray Scattering is published by Atlantic Publishers and Distributors (P) Ltd., 7/22, Ansari Road, Darya Ganj, New Delhi - 110002 INDIA, Email – customercare@atlanticbooks.com, Ph – 011-47320500 and was first released in 2005. The book contains 378 pages packed with valuable information. It is available in multiple formats including Paperback and Hardcover editions, making it convenient for all types of readers.

Who Is This Book For?

Whether you are a student, a professional looking to expand your knowledge, or simply someone who loves reading, Thin Film Analysis by X-Ray Scattering by M Birkholz is an excellent choice. Order your copy today from BookBajar and enjoy free shipping with Cash on Delivery option available across India.